TY  - RPRT
TI  - Amorphization along interfaces and grain boundaries in polycrystalline multilayers: An x-ray-diffraction study of Ni/Ti multilayers.
AU  - MA Hollanders
AU  - BJ Thijsse
AU  - EJ Mittemeijer
PY  - 1990
DO  - 10.1103/physrevb.42.5481
UR  - https://pubmed.ncbi.nlm.nih.gov/9996132/
ID  - 9996132
ER  -