TY  - RPRT
TI  - Defects in oxygen-implanted silicon-on-insulator structures probed with positrons.
AU  - B Nielsen
AU  - KG Lynn
AU  - TC Leung
AU  - BF Cordts
AU  - S Seraphin
PY  - 1991
DO  - 10.1103/physrevb.44.1812
UR  - https://pubmed.ncbi.nlm.nih.gov/9999718/
ID  - 9999718
ER  -