PubMed · 11371473
From images to interactions: high-resolution phase imaging in tapping-mode atomic force microscopy.
Abstract
In tapping-mode atomic force microscopy, the phase shift between excitation and response of the cantilever is used as a material-dependent signal complementary to topography. The localization of information in the phase signal is demonstrated with 1.4-nm lateral resolution on purple membrane of Halobacterium salinarum in buffer solution. In a first-order approximation, the phase signal is found to correlate with modulations of the tip oscillation amplitude, induced by topography. Extending the analysis to contributions of the tip-sample interaction area as a second-order approximation, a method is proposed to extract information about the interaction from the phase signal for surfaces with a roughness in the order of the tip radius.
Explore related subjects
Keep this discovery
Explore connections, maps & timelines
M Stark, C Möller, D J Müller, R Guckenberger. 2001. From images to interactions: high-resolution phase imaging in tapping-mode atomic force microscopy.. https://doi.org/10.1016/s0006-3495(01)76266-2
Cite the original work for its findings. Save a collection to share your selection of sources.