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PubMed · 15211041

Image quality improvement in a hard X-ray projection microscope using total reflection mirror optics.

Hidekazu Mimura·Kazuto Yamauchi·Kazuya Yamamura·Akihisa Kubota·Satoshi Matsuyama·Yasuhisa Sano·Kazumasa Ueno·Katsuyoshi Endo·Yoshinori Nishino·Kenji Tamasaku·Makina Yabashi·Tetsuya Ishikawa·Yuzo Mori
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Abstract

A new figure correction method has been applied in order to fabricate an elliptical mirror to realize a one-dimensionally diverging X-ray beam having high image quality. Mutual relations between figure errors and intensity uniformities of diverging X-ray beams have also been investigated using a wave-optical simulator and indicate that figure errors in relatively short spatial wavelength ranges lead to high-contrast interference fringes. By using a microstitching interferometer and elastic emission machining, figure correction of an elliptical mirror with a lateral resolution close to 0.1 mm was carried out. A one-dimensional diverging X-ray obtained using the fabricated mirror was observed at SPring-8 and evaluated to have a sufficiently flat intensity distribution.

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Equipment DesignEquipment Failure AnalysisMicroscopyOptics and PhotonicsReproducibility of ResultsSensitivity and SpecificityX-RaysEvaluation StudyJournal ArticleResearch Support, Non-U.S. Gov'tValidation Study

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BibTeXRIS

Hidekazu Mimura, Kazuto Yamauchi, Kazuya Yamamura, Akihisa Kubota, Satoshi Matsuyama, Yasuhisa Sano, Kazumasa Ueno, Katsuyoshi Endo, Yoshinori Nishino, Kenji Tamasaku, Makina Yabashi, Tetsuya Ishikawa, Yuzo Mori. 2004-06-23. Image quality improvement in a hard X-ray projection microscope using total reflection mirror optics.. https://doi.org/10.1107/s090904950401283x

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