PubMed · 15468699
Spatial carrier-fringe pattern analysis by means of wavelet transform: wavelet transform profilometry.
Abstract
We present an analysis of a spatial carrier-fringe pattern in three-dimensional (3-D) shape measurement by using the wavelet transform, a tool excelling for its multiresolution in the time- and space-frequency domains. To overcome the limitation of the Fourier transform, we introduce the Gabor wavelet to analyze the phase distributions of the spatial carrier-fringe pattern. The theory of wavelet transform profilometry, an accuracy check by means of a simulation, and an example of 3-D shape measurement are shown.
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Jingang Zhong, Jiawen Weng. 2004-09-10. Spatial carrier-fringe pattern analysis by means of wavelet transform: wavelet transform profilometry.. https://doi.org/10.1364/ao.43.004993
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