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A convenient and rapid sample repositioning approach for atomic force microscopy.

M Su·Z Pan·V P Dravid
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Abstract

A novel repositioning approach is described for repeated observations of a specimen at a close proximal location in the atomic force microscope. The approach is similar to keystone architecture, whereby the repositioning is achieved by forming a male structured base for the specimen, and a corresponding female counterpart as the frame. For the combination of an acrylic acid frame and a metal base, 90% translation shifts are less than 10 microm, and almost all angular disorientations are within +3 degrees to -3 degrees . Nanometre-scale surface features can be relocated easily and reliably even after 40 imaging-removal-imaging cycles, dipping the specimen in solutions or heating up to 500 degrees C.

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Microscopy, Atomic ForceNanotechnologyReproducibility of ResultsSensitivity and SpecificitySurface PropertiesJournal ArticleResearch Support, Non-U.S. Gov'tResearch Support, U.S. Gov't, Non-P.H.S.

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BibTeXRIS

M Su, Z Pan, V P Dravid. 2004. A convenient and rapid sample repositioning approach for atomic force microscopy.. https://doi.org/10.1111/j.0022-2720.2004.01406.x

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