Influence of the third-order parameter on diffuse reflectance at small source-detector separations.

Huijuan Tian; Ying Liu; Lijun Wang

doi:10.1364/ol.31.000933

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Influence of the third-order parameter on diffuse reflectance at small source-detector separations.

Huijuan Tian·Ying Liu·Lijun Wang

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Abstract

Spatially resolved reflectance close to source has received a great deal of attention recently. This research is considered to develop a new noninvasive technique for measuring the optical properties of biological media. Using Monte Carlo simulations, we investigated the influence of third-order parameter 5 on diffuse reflectance and found that the reflectance decreased with an increase of delta at a short source-detector separation of approximately 0.7-2 transport mean free paths. We show that the effects of two parameters, y and second-order parameter delta, on the reflectance are contrary. As a result the influence of the second-order parameter y on the reflectance is irregular when the condition delta delta<<delta gamma is not satisfied.

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Algorithms Artifacts Computer Simulation Image Enhancement Image Interpretation, Computer-Assisted Light Models, Biological Models, Statistical Monte Carlo Method Nephelometry and Turbidimetry Refractometry Scattering, Radiation Tomography, Optical Evaluation Study Journal Article Research Support, Non-U.S. Gov't

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Huijuan Tian, Ying Liu, Lijun Wang. 2006-04-01. Influence of the third-order parameter on diffuse reflectance at small source-detector separations.. https://doi.org/10.1364/ol.31.000933

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