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PubMed · 2391565

Scanning image detection (SID) system for conventional transmission electron microscope (CTEM) images.

T Tanji·M Tomita·H Kobayashi
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Abstract

A new image detection system has been developed to display transmission electron microscope (TEM) images on a CRT without a video camera system. Deflection coils placed in both the upper space of an objective lens and in the lower space of the first intermediate lens scan a small electron probe simultaneously. The electrical signal acquired through an improved scintillator and a photomultiplier is synchronized with the scanning signal and displayed in a similar fashion to a conventional scanning TEM (STEM) instrument. A preliminary system using a 100 kV conventional TEM (CTEM) equipped with a hairpin-type electron gun, produced an image with a spatial resolution of 1 nm.

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Image Processing, Computer-AssistedMagnesium OxideMicroscopy, ElectronJournal ArticleResearch Support, Non-U.S. Gov't

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T Tanji, M Tomita, H Kobayashi. 1990. Scanning image detection (SID) system for conventional transmission electron microscope (CTEM) images.. https://doi.org/10.1002/jemt.1060150409

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