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PubMed · 2651591

Observation of microdiffraction patterns with a dedicated STEM instrument.

J M Cowley·H J Ou
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Abstract

A two-dimensional detector system, designed for the observation and recording of microdiffraction patterns formed in an HB 5 scanning transmission electron microscopy (STEM) is described and discussed. Possibilities are described and demonstrated for the simultaneous or successive recording of microdiffraction patterns from regions of diameter 3 A or more, bright- or dark-field STEM images, EELS spectra, secondary electron images, and in-line holograms. Applications of the system have been made to studies of catalyst particles, reflection-mode imaging of bulk surfaces, and image reconstruction from microdiffraction patterns obtained from each point of a STEM image.

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Microscopy, Electron, ScanningX-Ray DiffractionJournal ArticleResearch Support, U.S. Gov't, Non-P.H.S.Review

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J M Cowley, H J Ou. 1989. Observation of microdiffraction patterns with a dedicated STEM instrument.. https://doi.org/10.1002/jemt.1060110209

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