Image registration in electron microscopy: application of a robust method.

N Bonnet; J C Liehn

doi:10.1002/jemt.1060100105

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Image registration in electron microscopy: application of a robust method.

N Bonnet·J C Liehn

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Abstract

The geometric registration of two electron microscopic images generally is performed by maximizing the cross-correlation coefficient between them. We show that a new similarity measure (the number of sign changes) is useful for performing simultaneously geometric and gray-level registration. This method is robust, which means that it provides a good estimation of the parameters even in the presence of outliers that cannot be described by the registration model.

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Computer Simulation Image Processing, Computer-Assisted Microscopy, Electron Microscopy, Electron, Scanning Journal Article Research Support, Non-U.S. Gov't

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N Bonnet, J C Liehn. 1988. Image registration in electron microscopy: application of a robust method.. https://doi.org/10.1002/jemt.1060100105

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