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Theoretical research on electron optics.

J Y Ximen
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Abstract

This paper summarizes theoretical research on electron optics in the field of electron microscopy that has been carried out by the author and his colleagues over a long period of time. The main topics to be discussed include the rotationally symmetrical imaging system and its aberrations; the method of matrix algebraic calculation and its applications to electron optics; new developments in scanning electron beam systems, i.e., the combined electromagnetic focusing-deflection system with superimposed fields; the electromagnetic multipole system and its aberrations; the ion optical system with a curvilinear axis and its aberrations; and the phase retrieval in Fourier electron microscopy. This review may help to promote a better understanding of the present state of, and trends in, Chinese electron optics research.

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MathematicsMicroscopy, Electron, ScanningOptics and PhotonicsJournal Article

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BibTeXRIS

J Y Ximen. 1987. Theoretical research on electron optics.. https://doi.org/10.1002/jemt.1060070413

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