PubMed · 4521050
Scanning transmission electron microscopy at high resolution.
Abstract
We have shown that a scanning transmission electron microscope with a high brightness field emission source is capable of obtaining better than 3 A resolution using 30 to 40 keV electrons. Elastic dark field images of single atoms of uranium and mercury are shown which demonstrate this fact as determined by a modified Rayleigh criterion. Point-to-point micrograph resolution between 2.5 and 3.0 A is found in dark field images of micro-crystallites of uranium and thorium compounds. Furthermore, adequate contrast is available to observe single atoms as light as silver.
Explore related subjects
Keep this discovery
Explore connections, maps & timelines
J Wall, J Langmore, M Isaacson, A V Crewe. 1974. Scanning transmission electron microscopy at high resolution.. https://doi.org/10.1073/pnas.71.1.1
Cite the original work for its findings. Save a collection to share your selection of sources.