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[Total materials characterization with the scanning electron microscope (author's transl)].

O Johari
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Luminescent MeasurementsMethodsMicroscopy, Electron, ScanningRadiationSpectrum AnalysisJournal Article

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O Johari. 1973. [Total materials characterization with the scanning electron microscope (author's transl)].. https://pubmed.ncbi.nlm.nih.gov/4762997/

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