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Starch granule surface imaging using low-voltage scanning electron microscopy and atomic force microscopy.

Abstract

High resolution imaging of wheat and potato starch granule surfaces has been performed using low-voltage scanning electron microscopy and atomic force microscopy. The complimentary images of uncoated granules demonstrate that the two starch types possess substantially different surface topologies; potato starch has many protrusions (100-300 nm in diameter), above a flatter surface containing 20-50 nm structures, whilst wheat starch possesses far fewer protrusions and generally has a smoother surface composed of approximately 20 nm structures. The protrusions are believed to be carbohydrate in nature and thus represent the ends of amylopectin side-chain clusters at the granule surface.

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BibTeXRIS

P M Baldwin, M C Davies, C D Melia. 1997. Starch granule surface imaging using low-voltage scanning electron microscopy and atomic force microscopy.. https://doi.org/10.1016/s0141-8130(97)00048-2

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