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PubMed · 9499588

ASIC-based event-driven 2D digital electron counter for TEM imaging.

G Y Fan·P Datte·E Beuville·J F Beche·J Millaud·K H Downing·F T Burkard·M H Ellisman·N H Xuong
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Abstract

A two-dimensional application specific integrated circuit (ASIC) based detector, designed for X-ray protein crystallography, has been tested to determine its suitability as a direct electron detector for TEM imaging in the voltage range of 20-400 keV. Several markedly different properties of this device distinguish it from the charge coupled device (CCD) detectors: (1) the ASIC detector can be used directly under electron bombardment in the voltage range stated above, therefore requiring no scintillator screen; (2) each active pixel of the device is an electron counter and generates digital output independently; (3) the readout of the device is frameless and event driven; (4) the device can be operated at the room temperature and is nearly noise free; and (5) the counting dynamic range of the device is virtually unlimited. It appears that an imaging system based on this type of device would be ideal for low-dose TEM imaging and online diffraction observation and recording, as well as more conventional imaging, providing the many advantages of direct digital readout for almost all applications.

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Crystallography, X-RayImage Processing, Computer-AssistedMicroscopy, ElectronProteinsLetterResearch Support, U.S. Gov't, P.H.S.

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BibTeXRIS

G Y Fan, P Datte, E Beuville, J F Beche, J Millaud, K H Downing, F T Burkard, M H Ellisman, N H Xuong. 1998. ASIC-based event-driven 2D digital electron counter for TEM imaging.. https://doi.org/10.1016/s0304-3991(97)00109-5

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