Structural characterization of metal-metal interfaces by intermediate-energy Auger-electron diffraction.
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Biomedical subjects
SA Chambers
Publications and source records attributed to SA Chambers.
Quantitative characterization of abrupt interfaces by angle-resolved Auger electron emission.
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Atomic structure of the Cu/Si(111) interface by high-energy core-level Auger electron diffraction.
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Characterization of intermixing at metal-semiconductor interfaces by angle-resolved Auger-electron emission: Cu/Si(111)-7 x 7.
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