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Takayoshi Tanji

Publications and source records attributed to Takayoshi Tanji.

3 recordsLinked to original sources

Development of a real-time stereo transmission electron microscope.

A new transmission electron microscope that allows for stereoscopic observations in real time at a video rate has been developed. In order to make stereo pairs at a high speed, illumination of a specimen from two directions instead of specimen tilting is adopted. Two electrostatic deflectors make it possible to alternate the illumination direction within a blank period of 1.2 ms between two adjacent video fields. Three dimensional displays give observers a stereo impression without the need for special glasses. By considering the circle of least confusion due to spherical aberration, a lateral resolution <1 nm and a longitudinal resolution of 6.3 nm are possible with a proper defocused condition. This improvement of the resolution is confirmed for the image of Au fine particles. The motion of objects in the lateral direction can be detected up to a speed of 8.3 nm s(-1). Using this microscope fine particles of ZnO were observed.

Journal Article↗

Off-axis electron holography without Fresnel fringes.

A new method for forming an electron hologram without Fresnel fringes caused by an electron biprism is presented. Adding a fine filament to the ordinary setup for off-axis electron holography directly prevented Fresnel diffraction at the electron biprism and eliminated 70% of the phase error due to the Fresnel diffraction. This made it possible to obtain a hologram having uniform interference fringes, and to reconstruct a clear phase image of a weak electric-field.

Artifacts↗

Direct observation of electrostatic microfields by four-electron-wave interference using two electron biprisms.

A new method has been developed for directly visualizing electromagnetic microfields in real time by the interference of four-electron waves obtained using a transmission electron microscope equipped with a field-emission gun and two electron biprisms. When one object wave and three reference waves interfere, equal-phase lines of the object wave are displayed as the intensity modulation of the interference fringes, in the manner same as in the three-electron-wave interference. The advantage of the four-electron-wave interference is that equal-phase lines are observed without precisely adjusting the angle between the two biprisms or rigorously controlling the fringe spacings of the two biprisms.

Holography↗