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Direct observation of electrostatic microfields by four-electron-wave interference using two electron biprisms.

Kimiya Miyashita·Kazuo Yamamoto·Tsukasa Hirayama·Takayoshi Tanji
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Abstract

A new method has been developed for directly visualizing electromagnetic microfields in real time by the interference of four-electron waves obtained using a transmission electron microscope equipped with a field-emission gun and two electron biprisms. When one object wave and three reference waves interfere, equal-phase lines of the object wave are displayed as the intensity modulation of the interference fringes, in the manner same as in the three-electron-wave interference. The advantage of the four-electron-wave interference is that equal-phase lines are observed without precisely adjusting the angle between the two biprisms or rigorously controlling the fringe spacings of the two biprisms.

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HolographyMicroscopy, Electron, TransmissionMicroscopy, InterferenceStatic ElectricityJournal ArticleResearch Support, Non-U.S. Gov't

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Kimiya Miyashita, Kazuo Yamamoto, Tsukasa Hirayama, Takayoshi Tanji. 2004. Direct observation of electrostatic microfields by four-electron-wave interference using two electron biprisms.. https://doi.org/10.1093/jmicro%2Fdfh074

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