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High resolution 3D x-ray diffraction microscopy.

Jianwei Miao·Tetsuya Ishikawa·Bart Johnson·Erik H Anderson·Barry Lai·Keith O Hodgson
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Abstract

We have imaged a 2D buried Ni nanostructure at 8 nm resolution using coherent x-ray diffraction and the oversampling phasing method. By employing a 3D imaging reconstruction algorithm, for the first time we have experimentally determined the 3D structure of a noncrystalline nanostructured material at 50 nm resolution. The 2D and 3D imaging resolution is currently limited by the exposure time and the computing power, while the ultimate resolution is limited by the x-ray wavelengths. We believe these results pave the way for the development of atomic resolution 3D x-ray diffraction microscopy.

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MicroscopyX-Ray DiffractionJournal ArticleResearch Support, U.S. Gov't, Non-P.H.S.Research Support, U.S. Gov't, P.H.S.

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Jianwei Miao, Tetsuya Ishikawa, Bart Johnson, Erik H Anderson, Barry Lai, Keith O Hodgson. 2002-08-06. High resolution 3D x-ray diffraction microscopy.. https://doi.org/10.1103/physrevlett.89.088303

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