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PubMed · 14326070

SILICEA.

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W GUTMAN. SILICEA.. https://pubmed.ncbi.nlm.nih.gov/14326070/

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Partial dewetting of polyethylene thin films on rough silicon dioxide surfaces.

The effect of roughness on the dewetting behavior of polyethylene thin films on silicon dioxide substrates is presented. Smooth and rough silicon dioxide substrates of 0.3 and 3.2-3.9 nm root-mean-square roughness were prepared by thermal oxidation of silicon wafers and plasma-enhanced chemical vapor deposition on silicon wafers, respectively. Polymer thin films of approximately 80 nm thickness were deposited by spin-coating on these substrates. Subsequent dewetting and crystallization of the polyethylene were observed by hot-stage optical microscopy in reflection mode. During heating, the polymer films melt and dewet on both substrates. Further observations after cooling indicate that, whereas complete dewetting occurs on the smooth substrate surface, partial dewetting occurs for the polymer film on the rough surface. The average thickness of the residual film on the rough surface was determined by ellipsometry to be a few nanometers, and the spatial distribution of the polymer in the cavities of the rough surface could be obtained by X-ray reflectometry. The residual film originates from the impregnation of the porous surface by the polymer fluid, leading to the observed partial dewetting behavior. This new type of partial dewetting should have important practical consequences, as most real surfaces exhibit significant roughness.

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Infrared reststrahlen revisited: commonly disregarded optical details related to n<1.

Spectral ellipsometry has developed into a routine method applicable to the infrared spectral range. It can give both the refractive index (n) and the absorption index (k), which has so far only been determined for a limited number of compounds. It turns out that vibrations that have a dispersion with an interval of n<1 are by no means restricted to crystals, but occur with numerous compounds including polymers and liquids. In conventional infrared spectroscopy, one usually is not aware of such a situation and so the consequences are disregarded. These include the so-called reststrahlen (residual rays) bands and specific phenomena that occur when n matches the absorption index (the Berreman effect) or the refractive index of ambient air (vanishing reflection, the Christiansen effect). These and some typical applications are discussed, including model calculations and experimental data.

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