Recent studies of surface dynamic processes by reflection electron microscopy.

K Yagi; A Yamanaka; I Homma

doi:10.1002/jemt.1070200404

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Recent studies of surface dynamic processes by reflection electron microscopy.

K Yagi·A Yamanaka·I Homma

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Abstract

Reflection electron microscope studies of surface dynamic processes are reviewed and illustrated with recent new observations. They include: surface electromigration and current dependent structures of Si surfaces; surface etching by oxidation of Si surface; and growth of two dimensional alloyed adsorbate by co-deposition of metals on Si surface. The observations revealed details of the surface dynamic processes, which are difficult to obtain with other surface analysis techniques.

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Adsorption Alloys Electrochemistry Indium Microscopy, Electron Oxygen Silicon Surface Properties Journal Article Research Support, Non-U.S. Gov't

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K Yagi, A Yamanaka, I Homma. 1992-02-15. Recent studies of surface dynamic processes by reflection electron microscopy.. https://doi.org/10.1002/jemt.1070200404

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