PubMed · 15768961
[Method to measure spectrum intensity from laser plasma soft X-ray source].
Abstract
This paper presents a method to detect and measure spectrum intensity from a laser plasma soft X-ray source. A Channel Electron Multiplier (CEM) and a calibrated silicon photodiode were used as detectors in this method, the former is a nonstandard detector and the latter is a standard one. Charge-sensitive preamplifiers were used for measuring total charges generated by detectors, and a monochromator with high resolution was employed as the spectrometer. The formulae to calculate spectrum intensity from laser plasma soft X-ray source was given, based on the known grating efficiency of the monochromator, CEM's gain and responsivity of the silicon photodiode to photons.
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Qi-liang Ni, Yan Gong, Bo Chen, Jian-lin Cao. 2004. [Method to measure spectrum intensity from laser plasma soft X-ray source].. https://pubmed.ncbi.nlm.nih.gov/15768961/
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