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A device for precise alignment of electron beam and sample in the scanning electron microscope.

E D Gibson·J D Verhoeven
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Microscopy, Electron, ScanningJournal Article

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E D Gibson, J D Verhoeven. 1977. A device for precise alignment of electron beam and sample in the scanning electron microscope.. https://doi.org/10.1088/0022-3735%2F10%2F10%2F029

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