Stereological analysis in scanning electron microscopy.

Abstract

The traditional field of stereological analysis based on quantitative image analysis data is expanded to include scanning electron microscopy (SEM). Two major methodological advances enable useful results to be obtained: 1) Image recording of backscattered electrons using an annular semi-conductor detector; 2) Direct link between SEM and image analyser by means of an on-line coupling providing synchronisation of both sub-systems.