PubMed · 8237685
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S T Hecht. Failure-avoidance analysis: a brief introduction for neuroradiologists.. https://pubmed.ncbi.nlm.nih.gov/8237685/
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The cooling effect accompanying field electron emission has been considered for a single carbon nanotube (CNT) used as a field emission (FE) electron source. An improved model for the failure mechanism of field emitting CNTs has been proposed and validated. Our model predicts a maximum temperature (T-max) located at an interior point rather than the tip of the CNTs, and the failure of the CNT emitters tends to take place at the T-max point, inducing a segment by segment breakdown process. A combination of Joule heating and electrostatic force effect is proposed responsible for initiating the failure of the field emitting CNT and validated by in situ FE observation.
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The management of apparatus for diagnostic imaging is an important job for radiological technologists. In the last 10 years we have encountered 2227 malfunctions in 3652 days. We detected 163 cases at the initial check-up, which accounted for 7.3% of total cases. By performing an initial check-up, we detected one malfunction every 21 days and were able to keep the effects of mishaps to a minimum, prevent accidents, and obtain stable-quality images.