PubMed · 15450667
Surface charge compensation for a highly charged ion emission microscope.
Abstract
A surface charge compensation electron flood gun has been added to the Lawrence Livermore National Laboratory (LLNL) highly charged ion (HCI) emission microscope. HCI surface interaction results in a significant charge residue being left on the surface of insulators and semiconductors. This residual charge causes undesirable aberrations in the microscope images and a reduction of the time-of-flight (T-O-F) mass resolution when studying the surfaces of insulators and semiconductors. The benefits and problems associated with HCI microscopy and recent results of the electron flood gun-enhanced HCI microscope are discussed.
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J W McDonald, A V Hamza, M W Newman, J P Holder, D H G Schneider, T Schenkel. 2004. Surface charge compensation for a highly charged ion emission microscope.. https://doi.org/10.1016/j.ultramic.2004.06.008
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